The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Sep. 24, 2021
Applicant:
Snap Inc., Santa Monica, CA (US);
Inventors:
Jason Heger, Louisville, CO (US);
Russell Patton, Playa Vista, CA (US);
Assignee:
SNAP INC., Santa Monica, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/246 (2018.01); H04N 13/327 (2018.01); H04N 13/344 (2018.01); H04N 13/239 (2018.01); G01B 7/16 (2006.01); G01B 11/22 (2006.01); H04N 13/383 (2018.01); H04N 13/38 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); G01B 7/18 (2013.01); G01B 11/22 (2013.01); H04N 13/239 (2018.05); H04N 13/327 (2018.05); H04N 13/344 (2018.05); H04N 13/38 (2018.05); H04N 13/383 (2018.05); H04N 2013/0081 (2013.01);
Abstract
Eyewear including a sensor integrated into frame of eyewear. In one example, the sensor comprises a strain gauge, such as a metallic foil gauge, that is configured to sense and measure distortion of the frame when worn by a user and under different force profiles, by measuring a strain in the frame when bent. The measured strain by strain gauge is sensed by a processor, and the processor performs dynamic calibration of image processing based on the measured strain. The distortion measured by the strain gauge is used by the processor to correct calibration of the cameras, and the displays.