The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Mar. 10, 2023
Applicants:

Walter F. Kailey, Boulder, CO (US);

Florin Neagu, Boulder, CO (US);

Inventors:

Walter F. Kailey, Boulder, CO (US);

Florin Neagu, Boulder, CO (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); H04N 1/401 (2006.01); H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
H04N 1/4015 (2013.01); H04N 1/405 (2013.01);
Abstract

A printing system is disclosed. The printing system includes at least one physical memory device to store compensation logic and one or more processors coupled with the at least one physical memory device to execute the compensation logic to receive a contone image, receive a first halftone threshold array, receive alignment correction data and generate a halftoned print image based on the contone image, first halftone threshold array and the alignment correction data by applying the alignment correction data to shift one or more of the contone image, the halftoned print image and the halftone threshold array based on one or more non-zero values of the alignment correction data, wherein for non-zero values of the alignment correction data, the contone image and the halftone print image are shifted in relation to each other and the halftone threshold array is shifted based on the alignment correction data.


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