The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jan. 11, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yan Zhou, San Diego, CA (US);

Tao Luo, San Diego, CA (US);

Lei Xiao, San Jose, CA (US);

Muhammad Nazmul Islam, Littleton, MA (US);

Yong Li, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/336 (2015.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04B 17/336 (2015.01); H04W 24/10 (2013.01);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may transmit, to a base station, information indicating a Layer 1 signal to interference plus noise ratio (L1-SINR) measurement capability of the UE. In some aspects, the information indicating the L1-SINR measurement capability may include one or more individual configurations for one or more resources to carry a reference signal. The UE may receive, from the base station, a reference signal carried on the one or more resources based at least in part on the L1-SINR measurement capability. Numerous other aspects are provided.


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