The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
May. 28, 2020
Applicant:
Fujitsu Limited, Kawasaki, JP;
Inventor:
Hideyuki Jippo, Atsugi, JP;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16C 20/30 (2019.01); G06N 3/12 (2023.01); G06N 3/126 (2023.01); G06N 5/022 (2023.01); G06N 5/04 (2023.01); G06N 5/048 (2023.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G16C 20/40 (2019.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G16C 20/30 (2019.02); G06N 3/126 (2013.01); G06N 5/048 (2013.01); G16C 20/70 (2019.02); G06N 3/12 (2013.01); G06N 5/022 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G16C 20/40 (2019.02);
Abstract
An apparatus includes a memory and a processor coupled to the memory. The processor is configured to: determine a degree of similarity between a target material and a first material based on a structure and characteristic of each of the target material and the first material; predict a characteristic value of the target material based on a first value representing the characteristic of the first material; and output the predicted characteristic value.