The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Nov. 21, 2016
Seegene, Inc., Seoul, KR;
SEEGENE, INC., Seoul, KR;
Abstract
The present invention relates to a method for calibrating a data set of a target analyte in a sample, wherein a normalization coefficient for calibrating the data set is provided by using a reference value, a reference cycle and the data set, and the calibrated data set is obtained by applying the normalization coefficient to the signal values of the data set. The present method is very effective in removing the inter- and intra-instrument signal variations of data sets. Furthermore, since the present method can be configured in software, the instant method is capable of being applied universally to various analytical instruments (e.g., a real-time PCR instrument) regardless of manufacturer. Accordingly, the method by the present invention would be very useful in diagnostic data analysis.