The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
May. 05, 2020
Applicant:
Toyota Research Institute, Inc., Los Altos, CA (US);
Inventors:
Rares A. Ambrus, San Francisco, CA (US);
Vitor Guizilini, Santa Clara, CA (US);
Sudeep Pillai, Santa Clara, CA (US);
Adrien David Gaidon, San Jose, CA (US);
Assignee:
TOYOTA RESEARCH INSTITUTE, INC., Los Altos, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/56 (2022.01); G06N 3/08 (2023.01); G06T 7/50 (2017.01); G06F 18/214 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 20/56 (2022.01); G06F 18/214 (2023.01); G06N 3/08 (2013.01); G06T 7/50 (2017.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
Abstract
Systems and methods to improve machine learning by explicitly over-fitting environmental data obtained by an imaging system, such as a monocular camera are disclosed. The system includes training self-supervised depth and pose networks in monocular visual data collected from a certain area over multiple passes. Pose and depth networks may be trained by extracting data from multiple images of a single environment or trajectory, allowing the system to overfit the image data.