The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jul. 16, 2021
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Grant B. Boroughs, Southlake, TX (US);

Assignee:

Raytheon Company, Tewksbury, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/32 (2017.01); G06T 7/215 (2017.01); G06T 7/38 (2017.01);
U.S. Cl.
CPC ...
G06T 7/32 (2017.01); G06T 7/215 (2017.01); G06T 7/38 (2017.01);
Abstract

A computer-implemented system and method of image cross-correlation improves the sub-pixel accuracy of the correlation surface and subsequent processing thereof. One or both of the template or search windows are resampled using the fractional portions of the correlation offsets X and Y produced by the initial image cross-correlation. The resampled window is then correlated with the other original window to produce a resampled cross-correlation surface. Removing the fractional or sub-pixel offsets between the template and search windows improves the 'sameness' of the represented imagery thereby improving the quality and accuracy of the correlation surface, which in turn improves the quality and accuracy of the FOM or other processing of the correlation surface. The process may be iterated to improve accuracy or modified to generate resampled cross-correlation surfaces for multiple possible offsets and to accept the one with the most certainty.


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