The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Dec. 02, 2021
Applicants:
SK Hynix Inc., Gyeonggi-do, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventors:
Min Hyuk Kim, Daejeon, KR;
Daniel S. Jeon, Daejeon, KR;
Assignees:
SK hynix Inc., Icheon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 5/40 (2006.01); G06T 7/00 (2017.01); G01S 17/894 (2020.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G01S 17/894 (2020.01); G06T 5/40 (2013.01); G06T 5/50 (2013.01); G06T 7/0002 (2013.01); H04N 23/80 (2023.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A method of reduce the impact of noise on a depth image produced using a Time Of Flight (TOF) camera uses an infrared image produced from one or more phase-specific images captured by the TOF camera to determine whether to move pixels in the depth image from one phase section to another.