The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Oct. 19, 2021
The Regents of the University of California, Oakland, CA (US);
Aydogan Ozcan, Los Angeles, CA (US);
Yair Rivenson, Los Angeles, CA (US);
Luzhe Huang, Los Angeles, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A deep learning-based volumetric image inference system and method are disclosed that uses 2D images that are sparsely captured by a standard wide-field fluorescence microscope at arbitrary axial positions within the sample volume. Through a recurrent convolutional neural network (RNN) (referred to herein as Recurrent-MZ), 2D fluorescence information from a few axial planes within the sample is explicitly incorporated to digitally reconstruct the sample volume over an extended depth-of-field. Using experiments onand nanobead samples, Recurrent-MZ is demonstrated to increase the depth-of-field of a 63×/1.4 NA objective lens by approximately 50-fold, also providing a 30-fold reduction in the number of axial scans required to image the same sample volume. The generalization of this recurrent network for 3D imaging is further demonstrated by showing its resilience to varying imaging conditions, including e.g., different sequences of input images, covering various axial permutations and unknown axial positioning errors.