The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

May. 01, 2017
Applicant:

Pivotal Software, Inc., San Francisco, CA (US);

Inventor:

Woo Jae Jung, Menlo Park, CA (US);

Assignee:

Pivotal Software, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/248 (2019.01); G06F 16/28 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/248 (2019.01); G06F 16/2462 (2019.01); G06F 16/285 (2019.01);
Abstract

Systems, methods, and computer program products for estimating a Bayesian hierarchical regression model using parallelized and distributed Gibbs sampling are described. The techniques can be implemented to solve use cases where there is a response variable, e.g., number of store visits or web page visits, which is a variable of interest, and multiple explanatory variables, e.g., locations, temperatures, or prices, that may predict the response variable. The disclosed techniques build a model that explains and quantifies effects of the explanatory variables on the response variable on a distributed system. For instance, the disclosed techniques can build a model which has the capability to estimate that an X-degree increase in temperature at a certain time of year predicts a Y-percent increase in store visits. This estimation process is performed in parallel on multiple nodes of the distributed system.


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