The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jan. 28, 2021
Applicant:

Wuhan University, Hubei, CN;

Inventors:

Yigang He, Hubei, CN;

Wenjie Wu, Hubei, CN;

Hui Zhang, Hubei, CN;

Chaolong Zhang, Hubei, CN;

Liulu He, Hubei, CN;

Assignee:

WUHAN UNIVERSITY, Hubei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 17/18 (2006.01); G06N 3/08 (2023.01); G06F 119/22 (2020.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 17/18 (2013.01); G06N 3/08 (2013.01); G06F 2119/22 (2020.01);
Abstract

A method and a system for predicting a gas content in transformer oil based on a joint model are provided and belong a field of transformer failure prediction. The method includes the following: determining a type and a time series of gas to be predicted related to a failure, processing an original series by adopting empirical mode decomposition (EMD) and local mean decomposition (LMD) for a non-stationarity characteristic of a dissolved gas concentration series in oil; performing normalization on each sub-series component, dividing a training sample and a test sample; and establishing a deep belief network (DBN) prediction model for each of the sub-series components for training, performing superposition and reconstruction on the established DBN prediction model to perform characteristic extraction and classification on multi-dimensional data of the failure, evaluating prediction performance of the prediction model through calculating an error index.


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