The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jul. 08, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Chi Chen, Chengdu, CN;

Hailan Dong, Chengdu, CN;

Huijuan Fan, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0635 (2013.01); G06F 3/067 (2013.01); G06F 3/0613 (2013.01); G06F 3/0631 (2013.01);
Abstract

An apparatus comprises a processing device configured to identify storage workloads to be run on a storage system, and to determine a mix of input/output (TO) patterns associated with the identified storage workloads, the mix of IO patterns comprising a first set of IO patterns characterizing types of IO operations performed by a first storage workload and at least a second set of IO patterns characterizing types of IO operations performed by a second storage workload. The processing device is also configured to calculate an affinity metric for the mix of IO patterns, the calculated affinity metric characterizing a difference between (i) performance metrics for the mix of IO patterns running concurrently and (ii) the first and second sets of IO patterns running individually. The processing device is further configured to allocate the identified storage workloads to storage devices of the storage system based on the calculated affinity metric.


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