The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jul. 08, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ken Sugimoto, Tokyo, JP;

Norifumi Nishikawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2458 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2471 (2019.01); G06F 16/2255 (2019.01); G06F 16/2272 (2019.01);
Abstract

A data layout model generation system generates, with reinforcement learning, a node configuration and a data layout key in a distributed parallel database. This system includes a sample acquisition processor that acquires, on the basis of a predetermined acquisition method, sample data from data stored in the distributed parallel database, a data layout estimator having, as states in the reinforcement learning, the node configuration and the data layout key including information regarding an order of sorting columns that constitute the data and information regarding a method for distribution between nodes, the data layout estimator estimating layout of the data on the basis of the state and the sample data, a reward calculator that calculates a reward in the reinforcement learning on the basis of a result obtained by estimating the layout of the data, the node configuration, and a processing cost of a query executed on the distributed parallel database.


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