The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

May. 26, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hironobu Kuruma, Tokyo, JP;

Naoto Sato, Tokyo, JP;

Tomoyuki Myojin, Tokyo, JP;

Hideto Ogawa, Tokyo, JP;

Makoto Ishikawa, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 5/046 (2023.01); G05B 17/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01); G06N 5/046 (2013.01);
Abstract

To make validity of a prediction model created by machine learning be able to be verified with appropriate accuracy and efficiency. A software test apparatus includes a storage device configured to store a prediction model, and an arithmetic device. The arithmetic device is configured to accept inputs of a precondition, a constraint condition, and an approximation threshold value, convert the prediction model into a logical expression, analyze an approximation range based on the approximation threshold value with respect to the logical expression to simplify the logical expression, generate an inspection expression by combining the simplified logical expression with the precondition and negation of the constraint condition, search for, as a counterexample, a value satisfying the inspection expression, input the value to the prediction model to evaluate inspection accuracy when the counterexample exists, and output a result of the evaluation.


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