The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Sep. 01, 2021
Sap SE, Walldorf, DE;
Christian Martick, Wendisch Rietz, DE;
SAP SE, Walldorf, DE;
Abstract
Embodiments facilitate testing of software functions, by elaborating upon a small volume test sample originally provided by a developer. Where the original test sample is determined to be numerical, embodiments perform repetition techniques to generate corpuses of test data of varying scope representing operation over different timescales. For original test samples of greater complexity (e.g., including text and/or hierarchical output states of the software function), embodiments select a relevant Machine Learning (ML) model and apply that ML model to generate the corpuses of test data. These are then available for loading to measure one or more performance parameters (e.g., runtime, memory consumption; processing consumption; bandwidth) of the software function. Broadly reported non-linear behavior of performance parameter(s) may reveal lack of suitability of the generated data corpuses for testing. More specific non-linear behavior may indicate failure of the software function to pass certain tests.