The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Jan. 11, 2021
Nec Corporation, Tokyo, JP;
Shuichi Karino, Tokyo, JP;
Kazuhiko Isoyama, Tokyo, JP;
Yuji Kobayashi, Tokyo, JP;
Yoshiaki Sakae, Tokyo, JP;
Hiroki Tagato, Tokyo, JP;
Masato Yasuda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided is an information processing device which is capable of suppressing a deterioration in accuracy of detecting an anomaly and accuracy of analyzing the anomaly, while suppressing an increase in an amount of data to be stored. The information processing system includes anomaly detection unit that collects event data indicating a predetermined event detected in a process of a device to be monitored, determines whether a predetermined index value related to the event exceeds a preset first threshold, and instructs enhanced monitoring of the device to be monitored and the process related to the event when the index value exceeds the first threshold, and collection instruction unit that determines an additional event being an event to be additionally monitored when the enhanced monitoring is instructed, and instructs the device to be monitored, which is subjected to the enhanced monitoring, to monitor the determined additional event.