The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Dec. 23, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hyochul Kim, Yongin-si, KR;

Younggeun Roh, Seoul, KR;

Yeonsang Park, Seoul, KR;

Jaesoong Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/28 (2006.01); G01J 3/28 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 5/288 (2013.01); G01J 3/28 (2013.01); G02B 5/201 (2013.01); G02B 5/28 (2013.01);
Abstract

Provided are an optical filter and a spectrometer including the optical filter. The optical filter includes at least one first filter element having a first center wavelength of a first wavelength band, and at least one second filter element arranged on a same plane as the at least one first filter element, the at least one second filter element having a second center wavelength of a second wavelength band. The at least one first filter element includes a first bandpass filter including a plurality of first Bragg reflective layers and at least one first cavity provided between the plurality of first Bragg reflective layers, and a first multi-layer provided on the first bandpass filter, the first multi-layer having a center wavelength different than the first center wavelength of the first Bragg reflective layers in order to block light of a wavelength band other than the first wavelength band.


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