The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Dec. 10, 2021
Applicants:

Saori Yoshida, Miyagi, JP;

Suguru Sangu, Kanagawa, JP;

Inventors:

Saori Yoshida, Miyagi, JP;

Suguru Sangu, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/01 (2006.01); G02B 27/00 (2006.01); G01C 3/02 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0172 (2013.01); G01C 3/02 (2013.01); G02B 27/0093 (2013.01); G02B 2027/014 (2013.01); G02B 2027/0178 (2013.01);
Abstract

An optical device, a method of detecting inclination of a three-dimensional object, and a method of detecting a line-of-sight. The optical device includes a light source configured to irradiate an object with light, a detector configured to detect a position of the light reflected by the object, and circuitry configured to output data of a degree of inclination of the object obtained based on the position of the light and a prescribed parameter, and change the prescribed parameter based on the position of the light. The above methods include irradiating an object with light, detecting a position of the light reflected by the object, outputting data of a degree of inclination of the object obtained based on the position of the light and a prescribed parameter, and changing the prescribed parameter based on the position of the light.


Find Patent Forward Citations

Loading…