The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Oct. 29, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Stefan Fabris, Schwalmstadt, DE;
Jozsef Attila Gombos, Heerbrugg, CH;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Abstract
A microscope system for imaging at least one region of a sample includes: an image generating unit for microscopic imaging of a section of a sample region to be imaged acquired in an observation beam path; a movement unit for moving the section to be imaged into the observation beam path of the image generating unit; a graphic user interface displayed on a display for establishing a movement range corresponding to the sample region to be imaged by way of at least one user input, the graphic user interface displaying a coordinate system and, after input of at least one point in the displayed coordinate system, the movement range is established as a defined movement volume; and a control unit for activating the movement unit as a function of the defined movement volume so as to approach a set of sections corresponding to the defined movement volume in succession.