The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Apr. 08, 2020
Applicant:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Inventors:
Matthias Handloser, Bodolz/Lindau, DE;
Gerald Nitsch, Esslingen/Neckar, DE;
Vincent Vaccarelli, Hamburg, NY (US);
Assignee:
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 25/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/368 (2013.01); G02B 25/001 (2013.01);
Abstract
A system for a microscope includes a display and an input interface. The system is configured to reproduce, in response to a user input to the input interface, a virtual tour of use of the microscope via the display. The system can be applied, for example, for teaching of microscopy at schools and universities.