The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Sep. 02, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

David Silver, Haifa, IL;

Moshe Laifenfeld, Haifa, IL;

Tal Kaitz, Kiryat Ono, IL;

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 17/86 (2020.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 17/86 (2020.01); G01S 17/89 (2013.01);
Abstract

Imaging apparatus () includes a radiation source (), which emits pulsed beams () of optical radiation toward a target scene (). An array () of sensing elements () output signals indicative of respective times of incidence of photons in a first image of the target scene that is formed on the array of sensing elements. An image sensor () captures a second image of the target scene in registration with the first image. Processing and control circuitry () identifies, responsively to the signals, areas of the array on which the pulses of optical radiation reflected from corresponding regions of the target scene are incident, and processes the signals from the sensing elements in the identified areas in order measure depth coordinates of the corresponding regions of the target scene based on the times of incidence, while identifying, responsively to the second image, one or more of the regions of the target scene as no-depth regions.


Find Patent Forward Citations

Loading…