The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Mar. 11, 2022
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Tatsuya Sumiya, Tokyo, JP;

Shingo Yamanouchi, Tokyo, JP;

Masayuki Ariyoshi, Tokyo, JP;

Shinichi Morimoto, Tokyo, JP;

Masanori Sekido, Tokyo, JP;

Kazumine Ogura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/04 (2020.01); G06F 21/31 (2013.01); G01N 23/10 (2018.01);
U.S. Cl.
CPC ...
G01S 17/04 (2020.01); G01N 23/10 (2013.01); G06F 21/31 (2013.01);
Abstract

To shorten a waiting time for a belongings inspection, the present invention provides an inspection systemincluding an acquisition unitthat acquires material information including at least either one of a piece of personal unique information unique to each of inspection target persons, and a piece of environment information indicating a state value of an environment that changes at each inspection timing, and a determination unitthat determines a content of an inspection for the each inspection target person and/or at the each inspection timing, based on the material information.


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