The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jun. 21, 2021
Applicant:

Raytheon Technologies Corporation, Farmington, CT (US);

Inventors:

Mahmoud El Chamie, Rocky Hill, CT (US);

Amit Surana, Newington, CT (US);

Christoph Schulze, Albany, CA (US);

Ayman Elkfrawy, Oakland, CA (US);

Matthew L. Brantley, Jr., South Glastonbury, CT (US);

Ozgur Erdinc, Mansfield, CT (US);

Assignee:

RTX Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/44 (2006.01); G06N 20/00 (2019.01); G01N 29/04 (2006.01); G01N 29/265 (2006.01); G01N 29/28 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4472 (2013.01); G01N 29/043 (2013.01); G01N 29/0645 (2013.01); G01N 29/265 (2013.01); G01N 29/28 (2013.01); G01N 29/4427 (2013.01); G06N 20/00 (2019.01);
Abstract

A system for detecting a sub-surface defect comprising a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, the transducer configured to scan the part to create scan data of the scanned part; a pulser/receiver coupled to the transducer configured to receive and transmit the scan data; a processor coupled to the pulser/receiver, the processor configured to communicate with the pulser/receiver and collect the scan data; and the processor configured to detect the sub-surface defect and the processor configured to have a sub-surface defect confidence assessment and a prioritization for further human evaluation.


Find Patent Forward Citations

Loading…