The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Apr. 17, 2023
Applicant:

National Institutes for Quantum and Radiological Science and Technology, Chiba, JP;

Inventors:

Katsuhiro Mikami, Kyoto, JP;

Toshiyuki Kitamura, Kyoto, JP;

Shuji Kondo, Kyoto, JP;

Hajime Okada, Kyoto, JP;

Tetsuya Kawachi, Kyoto, JP;

Yoshinori Shimada, Osaka, JP;

Shinri Kurahashi, Osaka, JP;

Masaharu Nishikino, Kyoto, JP;

Noboru Hasegawa, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/34 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/348 (2013.01); G01N 29/2418 (2013.01);
Abstract

A measuring device for measuring an inspection target on the basis of vibration generated when the inspection target has been irradiated with laser light includes a condensing position deriving portion configured to derive an amount of adjustment of a distance between condensing lenses of a laser condensing unit configured to condense the laser light on the basis of a distance between a laser device configured to radiate the laser light and an irradiation location of the laser light and a communicating portion configured to transmit control information including information representing the amount of adjustment to the laser condensing unit.


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