The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Apr. 12, 2019
Rosen Swiss Ag, Stans, CH;
Michael Esseling, Sudlohn, DE;
Werner Thale, Wallenhorst, DE;
ROSEN Swiss AG, Stans, CH;
Abstract
Method is provided for determining the extent of defects, in particular of crack depths, in a test specimen. At least one transmitting transducer excites sound waves in the ultrasonic range, and the sound waves propagate in the form of a sound beam. The acoustic axis of the sound beam preferably forms an angle the normal to a surface of the test specimen facing the transmitting transducer. The sound waves couple into the test specimen obliquely and are reflected in particular in a V-shaped manner at a preferably outer interface of the test specimen. At least one receiving transducer spaced apart from the transmitting transducer receives the sound waves reflected at the interface of the test specimen. By means of an evaluation unit, an extent of a defect arranged within a sound path is determined from a reduction of the amplitude of the sound waves received by the receiving transducer. The transmitting transducer and the receiving transducer are guided past the test specimen at an at least substantially constant distance therefrom, and the sound waves are coupled into the test specimen with an advance section via a liquid medium. A device for detecting signals based on defects in a test specimen is also provided.