The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jun. 12, 2020
Applicant:

Zhejiang University, Zhejiang, CN;

Inventors:

Xiuqin Rao, Zhejiang, CN;

Yangyang Lin, Zhejiang, CN;

Yitian Wang, Zhejiang, CN;

Yanning Zhang, Zhejiang, CN;

Xiaomin Zhang, Zhejiang, CN;

Yibin Ying, Zhejiang, CN;

Haiyi Jiang, Zhejiang, CN;

Assignee:

ZHEJIANG UNIVERSITY, Zhejiang, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/85 (2006.01); G01N 15/02 (2006.01); G01N 33/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/85 (2013.01); G01N 15/0227 (2013.01); G01N 33/02 (2013.01); G01N 2021/8592 (2013.01);
Abstract

In a grain sampling and imaging device, a grain bin () is located under a sampling body (), a grain feed connector () is fixed to a top of the sampling body (), an observation window () is installed on the sampling body (), a camera () is installed above the observation window (); grains fall to a grain feed connector (), and then into the sampling body (), and then are sieved by multiple passages of the sampling body (), a part of the grains randomly enter the observation window () and photographed by the camera (), and finally all of the grains enter the grain bin () through a discharge outlet () provided at a bottom of the sampling body ().


Find Patent Forward Citations

Loading…