The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Mar. 23, 2018
Nec Corporation, Tokyo, JP;
Hiroaki Inotsume, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided is an inspection management device and the like capable of reducing, by an inspection robot, the number of pieces of measurement data indicating measurement failure. The inspection management device includes: a data analysis unit that determines success or failure in measurement at a measurement position of a structure based on measurement data output from an inspection robot that inspects the structure in accordance with an inspection plan, the measurement data being output each time when the inspection robot performs measurement, and estimates a cause of measurement failure in accordance with a determination result; and an inspection planning unit that corrects the inspection plan based on the estimated cause and outputs the corrected inspection plan.