The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Feb. 18, 2022
M & H Inprocess Messtechnik Gmbh, Waldburg, DE;
Christoph Wiest, Weingarten, DE;
M & H Inprocess Messtechnik GmbH, Waldburg, DE;
Abstract
A measuring system for acquiring measured values by scanning, including an interface for connection to a control unit of a machine. The system is arranged on a movement axis of the machine, and an object can be measured by a measuring instrument of the system. During the measurement of the object, the measuring instrument generates a measured value that is stored in a control unit, that processes and stores the measured value. The control unit has a control module that reads out a position coordinate from the machine via the interface and compares the read-out position coordinate with a specified coordinate target range, and/or compares a time of a timer with a specified point in time, and releases a trigger signal if the control module detects that the position coordinate lies in the coordinate target range and/or if the time has reached or passed the specified point in time.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile