The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jan. 25, 2017
Applicant:

Primes Gmbh Meßtechnik Für Die Produktion Mit Laserstrahlung, Pfungstadt, DE;

Inventors:

Reinhard Kramer, Pfungstadt, DE;

Otto Märten, Dreieich, DE;

Stefan Wolf, Groß-Gerau, DE;

Roman Niedrig, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/70 (2014.01); B23K 26/042 (2014.01); B29C 64/135 (2017.01); B29C 64/386 (2017.01); B23K 26/082 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B29C 64/153 (2017.01); G01J 1/42 (2006.01); B29C 64/268 (2017.01); G01J 1/04 (2006.01); B23K 26/03 (2006.01); B23K 26/342 (2014.01); B23K 26/06 (2014.01); B29C 67/00 (2017.01); G02B 26/10 (2006.01); G01J 1/02 (2006.01); B22F 10/28 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B22F 10/31 (2021.01);
U.S. Cl.
CPC ...
B23K 26/705 (2015.10); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B23K 26/032 (2013.01); B23K 26/042 (2015.10); B23K 26/0648 (2013.01); B23K 26/082 (2015.10); B23K 26/342 (2015.10); B29C 64/135 (2017.08); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B29C 64/386 (2017.08); B29C 67/00 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); G01J 1/0266 (2013.01); G01J 1/0411 (2013.01); G01J 1/0414 (2013.01); G01J 1/4228 (2013.01); G01J 1/4257 (2013.01); G02B 26/101 (2013.01); B22F 2999/00 (2013.01); G01J 2001/4261 (2013.01); Y02P 10/25 (2015.11);
Abstract

The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components () by means of layered solidification of a construction material () by an energy beam (). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (), a processing plane (), and a layer applicator (). The device according to the invention comprises a movable beam barrier (), a movable beam sampling module () and a measuring device () with a radiation detector ().


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