Scattered ray model derivation device, scattered ray model derivation method, scattered ray model derivation program, radiation image processing device, radiation image processing method, and radiation image processing program

Abstract

At least one standard image representing a standard object having different thicknesses, the at least one standard image being obtained by imaging the standard object by radiation in a state in which an object is interposed between the standard object and a radiation detector is acquired, a relationship between the thickness of the standard object and a radiation attenuation coefficient of the standard object, which corresponds to an energy characteristic of the radiation, the relationship reflecting an influence of beam hardening by the standard object and the object, is derived, a primary ray component corresponding to the thickness of the standard object included in the standard image is derived based on the relationship between the thickness of the standard object and the radiation attenuation coefficient of the standard object, a scattered ray component corresponding to the thickness of the standard object included in the standard image is derived based on a difference between the standard image and the primary ray component, and a scattered ray model representing a relationship between the thickness of the standard object and a ratio of the scattered ray component to the primary ray component is derived.