The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Feb. 25, 2022
Applicant:

Vieworks Co., Ltd., Anyang-si, KR;

Inventor:

Ju Yon Leem, Seongnam-si, KR;

Assignee:

VIEWORKS CO., LTD., Anyang-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/483 (2013.01); A61B 6/4208 (2013.01); A61B 6/5282 (2013.01);
Abstract

Provided is a method for compensating scattering of an X-ray image, which includes: (a) receiving an original X-ray image as an input; (b) initializing a primary image into the original X-ray image; (c) estimating a scattered image from the primary image; (d) updating the primary image by using the original X-ray image and the scattered image; (e) judging whether a termination condition is satisfied; (f) iterating steps (c) to (e) above by using the primary image updated through step (d) above into the primary image for step (c) above when the termination condition is not satisfied; and (g) outputting the primary image updated through step (d) above as a scattering compensated image when the termination condition is satisfied.


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