The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 16, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Saikat Hazra, Bengaluru, IN;
Avneesh Singh Verma, Bengaluru, IN;
Raghavendra Molthati, Bengaluru, IN;
Sunil Rajan, Bengaluru, IN;
Tamal Das, Bengaluru, IN;
Ankit Garg, Bengaluru, IN;
Praveen S Bharadwaj, Bengaluru, IN;
Sanjeeb Kumar Ghosh, Bengaluru, IN;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Methods and systems for calibrating clock skew in a SerDes receiver. A method includes detecting a skew in a clock with respect to an edge of a reference clock, based on a value sampled by the clock and a value sampled by the reference clock at an edge of a data pattern, for a first Phase Interpolator (PI) code; determining a count of the skew from a de-serialized data word including outcome values obtained based on values sampled by the clock and values sampled by the reference clock at a predefined number of edges of the data pattern; obtaining a skew calibration code corresponding to the first PI code, from a binary variable obtained by accumulating an encoded variable to a previously generated binary variable; and calibrating the skew by performing a positive phase shift or a negative phase shift to the clock based on the skew calibration code.