The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 14, 2018
Nec Corporation, Tokyo, JP;
B. G. Negev Technologies and Applications Ltd. AT Ben-gurion University, Beer-Sheva, IL;
Masaki Inokuchi, Tokyo, JP;
Yoshinobu Ohta, Tokyo, JP;
Ron Bitton, Yehud, IL;
Orly Stan, Ashdod, IL;
Asaf Shabtai, Hulda, IL;
Yuval Elovici, Arugot, IL;
NEC CORPORATION, Tokyo, JP;
B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University, Beer-Sheva, IL;
Abstract
A security assessment system is configured to provide a duplicated environment which duplicates an assessment target system comprising a plurality of physical components. The security assessment system includes a duplicated environment design circuitry and a duplicated environment construction circuitry. The duplicated environment design circuitry is configured to select a duplication level based on constraints specified by a user in order to design the duplicated environment to produce a designed result indicative of a duplicated environment design. The duplication level is indicative of any one of a simulation sub-module, an emulation sub-module, and a physical sub-module which are for reproducing the physical components of the assessment target system. The duplicated environment construction circuitry is configured to construct the duplicated environment based on the designed result. The duplicated environment includes components which are duplicated by one of the duplication level.