The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Sep. 23, 2022
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Shivam Agarwal, Allahabad, IN;

Aditya Yadav, Alwar, IN;

Jai Kumar, Rohtak, IN;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/04 (2022.01); H04L 43/067 (2022.01); H04L 43/028 (2022.01); H04L 43/0811 (2022.01);
U.S. Cl.
CPC ...
H04L 43/028 (2013.01); H04L 43/04 (2013.01); H04L 43/067 (2013.01); H04L 43/0811 (2013.01);
Abstract

Systems and methods are provided for addressing issues caused by interruptions that may occur while operating under the Metro Ethernet Forum (MEF) 35.1 standard. A method, according to one implementation, includes obtaining PM data during a current Measurement Interval of an ongoing PM session in accordance with MEF 35.1. The PM data can be locally stored as a current dataset and reported at the end of the current Measurement Interval for storage in a history database. Following an interruption event that interrupts at least the current Measurement Interval, the method detects a recommencement event that clears the interruption event and allows a PM session to resume. The method further includes determining a number of Measurement Intervals affected by the interruption event based on an end time of a last-reported Measurement Interval and then inserting the number of affected Measurement Intervals into the history database after the last-reported Measurement Interval.


Find Patent Forward Citations

Loading…