The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 27, 2020
Yale University, New Haven, CT (US);
Kyungjoo Noh, New Haven, CT (US);
Steven M. Girvin, Hamden, CT (US);
Liang Jiang, Guilford, CT (US);
Yale University, New Haven, CT (US);
Abstract
Systems and methods for performing bosonic quantum error correction (QEC) using Gottesman-Kitaev-Preskill (GKP) states are provided. An ancilla quantum mechanical oscillator is used to probe Gaussian noise experienced by a data quantum mechanical oscillator without disturbing the state of the data quantum mechanical oscillator. The ancilla quantum mechanical oscillator is initialized with a GKP state and entangled with the state of a data quantum mechanical oscillator to correlate any noise experienced by the data state with the state of the ancilla quantum mechanical oscillator. The states are then disentangled, and momentum and position quadrature operators of the ancilla quantum mechanical oscillator are measured and used to perform QEC on the information stored in the data quantum mechanical oscillator.