The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Feb. 28, 2022
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Jaybum Kim, Seoul, KR;

Seryeong Kim, Asan-si, KR;

Junhyung Lim, Seoul, KR;

Taesang Kim, Seoul, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 29/66 (2006.01); H01L 27/146 (2006.01); H01L 29/04 (2006.01); H01L 27/12 (2006.01); H10K 59/00 (2023.01); H10K 59/121 (2023.01); H10K 59/123 (2023.01);
U.S. Cl.
CPC ...
H01L 29/6675 (2013.01); H01L 27/1222 (2013.01); H01L 27/1225 (2013.01); H01L 27/1251 (2013.01); H01L 27/1255 (2013.01); H01L 27/14692 (2013.01); H01L 29/04 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); H10K 59/00 (2023.02); H10K 59/1213 (2023.02); H10K 59/1216 (2023.02); H10K 59/123 (2023.02);
Abstract

A semiconductor device includes a base substrate. A first thin-film transistor is disposed on the base substrate. The first thin-film transistor includes a first input electrode, a first output electrode, a first semiconductor pattern disposed below a first insulating layer, and a first control electrode disposed on the first insulating layer and below a second insulating layer. A second thin-film transistor includes a second input electrode, a second output electrode, a second semiconductor pattern disposed on the second insulating layer, and a second control electrode disposed on an insulating pattern formed on the second semiconductor pattern and exposes a portion of the second semiconductor pattern. The first semiconductor pattern includes a crystalline semiconductor. The second semiconductor pattern incudes an oxide semiconductor. The first semiconductor pattern, the first control electrode, the second semiconductor pattern, and the second control electrode are overlapped.


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