The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Jan. 19, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-Si, KR;

Inventors:

Kwan-Yup Shin, Yongin-si, KR;

Jun-Ho Bae, Asan-si, KR;

Mi-Sun Lee, Sejong-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3648 (2013.01); G09G 2300/0426 (2013.01); G09G 2330/12 (2013.01);
Abstract

A gate test part includes a plurality of composite pads electrically connected to a plurality of gate lines. The gate lines extend in a first direction and are disposed along a second direction crossing the first direction. Each of the composite pads includes an antistatic pad, a first test pad spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines, and a second test pad overlapping the antistatic pad and the first test pad. The second test pad electrically connects the antistatic pad and the first test pad.


Find Patent Forward Citations

Shin, Kwan-Yup. (2024). Gate test part and display device including the same (U.S. Patent No. 11908358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11908358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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