The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Dec. 23, 2020
Ialyze, Llc, Chapel Hill, NC (US);
Willem Prins, Chapel Hill, NC (US);
Alexander Adam Papp, Raleigh, NC (US);
Matthew E. Czajkowski, Chapel Hill, NC (US);
iAlyze, LLC, Chapel Hill, NC (US);
Abstract
Impairment analysis systems and related methods are disclosed. According to an aspect, an impairment analysis system includes a light source configured for directing light towards a subject. Further, the system includes a distance sensor configured for determining a location of the subject. The system also includes an image capture device configured for capturing one or more images of the subject. Further, the system includes a computing device configured to control the light source to emit light in a predetermined pattern to apply light stimulus to the subject. The computing device is also configured to receive, from the distance sensor, information regarding the determined location of the subject. Further, the computing device is configured to receive, from the image capture device, the captured one or more images of the subject including one of a facial movement and position of the subject while the light stimulus is applied to the subject.