The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 15, 2021
Qualcomm Incorporated, San Diego, CA (US);
Shizhong Liu, San Diego, CA (US);
Jincheng Huang, San Diego, CA (US);
Weiliang Liu, San Diego, CA (US);
Jianfeng Ren, San Diego, CA (US);
Sahul Madanayakanahalli Phaniraj Venkatesh, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Artefacts in a sequence of image frames may be reduced or eliminated through modification of an input image frame to match another image frame in the sequence, such as by geometrically warping to generate a corrected image frame with a field of view matched to another frame in sequence of frames with the image frame. The warping may be performed based on a model generated from data regarding the multi-sensor device. The disparity between image frames may be modeled based on image captures from the first and second image sensor for scenes at varying depths. The model may be used to predict disparity values for captured images, and those predicted disparity values used to reduce artefacts resulting from image sensor switching. The predicted disparity values may be used in image conditions resulting in erroneous actual disparity values.