The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Sep. 26, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Namit Kabra, Hyderabad, IN;

Ritesh Kumar Gupta, Hyderabad, IN;

Vijay Ekambaram, Chennai, IN;

Smitkumar Narotambhai Marvaniya, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Targeted acquisition of data for model training includes automatically generating metadata describing samples, of an initial dataset, in neighborhoods of an embedding space in which the samples are embedded. The samples described by the automatically generated metadata are classified by a classification model, and include both correctly classified samples in the neighborhoods and incorrectly classified samples in the neighborhoods. Additionally, attributes of one or more correctly classified samples of the collection of samples and one or more incorrectly classified samples of the collection of samples are identified, and queries are generated based on the identified attributes, the queries tailored, based on the attributes, to retrieve additional training data for training the classification model to more accurately classify samples and avoid incorrect sample classification.


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