The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Oct. 21, 2019
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Blake Alan Hechtman, Mountain View, CA (US);

Sameer Kumar, Mountain View, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06N 3/084 (2023.01); G06N 3/044 (2023.01); G06N 3/08 (2023.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/044 (2023.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G06V 10/82 (2022.01);
Abstract

Methods, systems, and apparatus, including instructions encoded on storage media, for performing reduction of gradient vectors for distributed training of a neural network. One of the methods includes receiving, at each of the plurality of devices, a respective batch; performing, by each device, a forward pass comprising, for each batch normalization layer: generating, by each of the devices, a respective output of the corresponding other layer for each training example in the batch, determining, by each of the devices, a per-replica mean and a per-replica variance; determining, for each sub-group, a distributed mean and a distributed variance from the per-replica means and the per-replica variances for the devices in the sub-group; and applying, by each device, batch normalization to the respective outputs of the corresponding other layer generated by the device using the distributed mean and the distributed variance for the sub-group to which the device belongs.


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