The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Nov. 01, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Masaki Fujita, Tokyo, JP;

Toshihiro Kobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/33 (2018.01); G06F 8/70 (2018.01); G06F 9/44 (2018.01); G06F 8/71 (2018.01); G06F 11/36 (2006.01); G06F 8/75 (2018.01);
U.S. Cl.
CPC ...
G06F 8/75 (2013.01);
Abstract

A time period required for analyzing a source code is reduced without reducing analysis accuracy in a source code analysis apparatus that analyzes a source code with a dynamic analysis method. An analysis processing unit extracts, from a post-change source code, an influence function to which an input is given by a change function. An analysis necessity determination processing unit determines whether or not the function is the analysis target function, based on a range of an input value input to the change function and a function included in the influence function. The analysis processing unit performs an analysis of the analysis target function, which is included in the change function and the influence function. An analysis result processing unit outputs an analysis result of the post-change source code, which includes an analysis result of the analysis target function.


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