The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Nov. 02, 2022
Applicant:

Tianjin University, Tianjin, CN;

Inventors:

Lei Zhao, Tianjin, CN;

Molin Su, Tianjin, CN;

Yongdian Han, Tianjin, CN;

Lianyong Xu, Tianjin, CN;

Kangda Hao, Tianjin, CN;

Assignee:

TIANJIN UNIVERSITY, Tianjin, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G01N 33/20 (2019.01); G01N 33/2045 (2019.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G01N 33/2045 (2019.01); G06F 2111/10 (2020.01);
Abstract

A method for characterizing propagation of metallic short cracks and long cracks includes: acquiring crack tip opening displacement in a metallic notched sample under cyclic loading; acquiring crack tip opening displacement amount caused by a single monotonic tensile in the notched sample, and crack tip opening displacement caused by monotonic tensile in the notched sample under a maximum far-field stress; and based on an original Shyam model, constructing, according to the crack tip opening displacement amount and the crack tip opening displacement by obtaining yield strength of metals, a Tφmodel for characterizing the propagation of short cracks and long cracks, where the Tφmodel is used for representing the growth rate of short cracks and long cracks.


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