The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Oct. 21, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventor:

Marc Vincent Robichaud, San Francisco, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/31 (2019.01); G06F 3/04842 (2022.01);
U.S. Cl.
CPC ...
G06F 16/313 (2019.01); G06F 3/04842 (2013.01);
Abstract

First one or more values are extracted from a plurality of events using a first extraction rule. The extracted first one or more values are assigned to a first field of the plurality of events as a first set of field-data item pairs and a field label is assigned to the first field. Second one or more values and a field label corresponding to the second one or more values are extracted from the plurality of the events using a second extraction rule, where the extracted field label corresponds to the assigned field label of the first field. The extracted second one or more values are assigned to a second field of the plurality of events as a second set of field-data item pairs, thereby distinguishing the extracted second one or more values from the extracted first one or more values.


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