The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Apr. 26, 2021
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Weilan Pu, Chengdu, CN;

Jian Kang, Chengdu, CN;

Chi Chen, Chengdu, CN;

Wen Chen, Sichuan, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01);
Abstract

Techniques for managing data patterns involve: acquiring multiple sets of data patterns respectively associated with multiple collection devices, wherein a set of data patterns in the multiple sets of data patterns represent patterns of duplicate data in data from one of the multiple collection devices; dividing the multiple collection devices into multiple groups based on clusters of the multiple sets of data patterns; and determining, based on sets of data patterns associated with collection devices in a group in the multiple groups, a set of shared data patterns for sharing among the collection devices in the group. Accordingly, data patterns that can be shared among multiple collection devices can be determined in a more accurate and effective manner, thereby facilitating the removal of duplicate data from the multiple collection devices.


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