The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Dec. 12, 2019
Hitachi Astemo, Ltd., Ibaraki, JP;
Masashi Mizoguchi, Tokyo, JP;
Takahiro Iida, Tokyo, JP;
Toru Irie, Ibaraki, JP;
Yoshimi Yamazaki, Ibaraki, JP;
HITACHI ASTEMO, LTD., Ibaraki, JP;
Abstract
An appropriate test environment is selected while preventing test cases from being detained therein. A test environment determination device includes: an element selection unit that selects one or more test targets and one or more test environments for executing a test case based on target requirements described for specifications of an electronic control unit, which is a test target, and environment requirements described for specifications of a test environment for simulating an external environment of the test target; an environment operation information acquisition unit that acquires operation information on the test environments; and an environment selection unit that selects a combination of the selected test target and the selected test environment based on the acquired operation information.