The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Mar. 28, 2023
Applicant:

Rebellions Inc., Seongnam-si, KR;

Inventor:

Jinseok Kim, Seongnam-si, KR;

Assignee:

Rebellions Inc., Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 15/78 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3495 (2013.01); G06F 11/3404 (2013.01); G06F 11/3409 (2013.01); G06F 11/3447 (2013.01); G06F 15/781 (2013.01);
Abstract

A method for measuring performance of neural processing devices and devices for measuring performance are provided. The method for measuring performance of neural processing devices comprises receiving hardware information of a neural processing device, modeling hardware components according to the hardware information as agents, dividing a calculation task by events for the agents and modeling the calculation task, thereby generating an event model which includes nodes corresponding to the agents and edges corresponding to the events and measuring a total duration of the calculation task through simulation of the event model.


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