The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Oct. 16, 2019
Siemens Ltd., China, Beijing, CN;
Xiao Yin Che, Beijing, CN;
Hao Tian Hui, Suzhou, CN;
Jiao Jian Wang, Nanjing, CN;
Ruo Gu Sheng, Beijing, CN;
Daniel Schneegaß, Beijing, CN;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
Various embodiments of the teachings herein include a fault processing method comprising: receiving two historical faults similar to a target fault; searching keywords in a description of the target fault and each historical fault, wherein the keywords are classified into N grades, and for each system component in a grade, the grade comprises at least one keyword for describing the component, wherein N is an integer no less than 2; for each of the N grades, counting a quantity of identical system components represented by the keywords in the text description of each historical fault and the target fault; and comparing a degree of similarity of each historical fault to the target fault according to the quantity of identical system components counted in each grade of the N different grades, wherein a historical fault relating to a larger number of high-grade identical system components has a higher degree of similarity to the target fault.