The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Nov. 11, 2021
Applicant:

Horiba Stec, Co., Ltd., Kyoto, JP;

Inventors:

Kotaro Takijiri, Kyoto, JP;

Ojiro Takamune, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 11/13 (2006.01); G05B 17/02 (2006.01); G01N 21/3504 (2014.01); C23C 16/44 (2006.01); C23C 16/448 (2006.01);
U.S. Cl.
CPC ...
G05D 11/138 (2013.01); C23C 16/4401 (2013.01); C23C 16/448 (2013.01); C23C 16/4408 (2013.01); G01N 21/3504 (2013.01); G05B 17/02 (2013.01); G05D 11/132 (2013.01); G05D 11/135 (2013.01);
Abstract

Provided is a concentration control system that has only a small time delay, obtains accurate estimated values, and also enables partial pressure control having improved responsiveness and accuracy. The system includes a flow rate control device provided on a supply flow path that supplies gas to a chamber, and controls a flow rate of a gas in the supply flow path to match a set flow rate, a partial pressure measurement device for a gas inside the chamber, an observer having a model which estimates a state of the gas inside the chamber, where a flow rate of the gas flowing into the chamber and measured partial pressures are input into the model, and an estimated partial pressure of the gas within the chamber is output, and a controller that, based on a set partial pressure and on the estimated partial pressure, sets the set flow rate.


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