The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jul. 29, 2022
Prüftechnik Dieter Busch Gmbh, Ismaning, DE;
Dietrich Brunn, Unterföhring, DE;
Jan Germer, Munich, DE;
Prüftechnik Dieter Busch GmbH, Ismaning, DE;
Abstract
A monitoring device for detecting a diagnostic state of an industrial machine on the basis of vibrations associated with the industrial machine, includes at least one measurement transducer for detecting at least one first signal characterizing the vibration of the industrial machine in a time period and for detecting at least one second signal characterizing the vibration of the industrial machine in the same time period, wherein the at least one measurement transducer has at least one signal processor for evaluating the at least first signal as a first characteristic value and for evaluating the at least second signal as a second characteristic value and wherein the at least one first characteristic value and the at least one second characteristic value form a characteristic value tuple, further having a storage unit, in which different diagnostic states describing the state of the industrial machine are saved, wherein the diagnostic states are determined as a function of the characteristic value tuple, and a predefined scalar range is saved with predetermined different fixed scalar values, which define respectively an existing limit potential, wherein a respective limit potential characterizes a change in the diagnostic state, and wherein between adjacent limit potentials a diagnostic partition is formed and wherein different scalar values from the scalar range are assigned to the different diagnostic partitions and wherein different respective diagnostic partitions represent different diagnostic states of the industrial machine, and wherein the monitoring device has at least one interpolation function for mapping the characteristic value tuple on a common, unique, time-dependent scalar value in the predefined scalar range, so that by way of the time-dependent scalar value a time monitoring of the diagnostic state of the industrial machine is achieved.